2012 MRQW Proceedings

Corporate Staff
posted July 03, 2013

Microelectronics Reliability and Qualification Workshop

MRQW FINAL LOGO bwDECEMBER 11 & 12, 2012—SHERATON GATEWAY HOTEL LOS ANGELES

The workshop provides a forum for discussing issues in all areas of microelectronics reliability and qualification for high-reliability and commercial applications. Technical sessions and keynote speakers cover the latest results or work in progress in microelectronics devices.

Combined presentations may be downloaded by clicking here.

Presentations not linked are not available. All documents are posted with permission.

Tuesday, December 11

  • Welcoming Remarks and Overview of the Technical Program – Ronald Lacoe, MRQW General Chair and Technical Program Chair, The Aerospace Corporation
  • Keynote Address: Mars Curiosity Mission – Matt Wallace, Jet Propulsion Laboratory

Session I: Device Reliability

Chair: Daniel Marrujo, DMEA

Session II: Packaging

Chair: Ken Hunt, Air Force Research Laboratory, Space Vehicles Directorate

Session III: HiREV Program

Chair: Donald Dorsey, Air Force Research Laboratory, Materials and Manufacturing Directorate

Wednesday, December 12

  • Keynote Address: High Reliability Microelectronics – Enabling National Security Mission Success – Wayne Goodman, The Aerospace Corporation

Session IV: Radiation Effects

Chair: Brian Wie, Integrity Applications Incorporated

Session V: FPGAs and Structured Arrays

Chair: Jon Osborn, The Aerospace Corporation

 Session VI: Government Programs

Chair: Dave Eccles, The Aerospace Corporation

 Session VII: Memories Session

Chair: Doug Sheldon, Jet Propulsion Laboratory

Session VIII: Failure Analysis

Chair: Brendan Foran, The Aerospace Corporation