General Information

Microelectronics Reliability & Qualification Workshop

December 7-8, 2010
Manhattan Beach Marriott, Manhattan Beach, Calif.

The Microelectronics Reliability and Qualification Workshop (MRQW) provides a forum for the open discussion of microelectronics reliability and qualification issues for microelectronics targeted for use in space systems. The 2009 workshop format will consist of several main technical sessions with a keynote speaker to open the workshop. The MRQW program provides subjects of interest to professionals with all levels of expertise. The workshop also offers many industry networking opportunities, including two conference luncheons and a hosted welcome reception on Tuesday night.

Who should attend this workshop? Reliability engineers, radiation-effects engineers, microelectronic technology developers, those working on microelectronic parts procurement for space systems, and anyone interested in the reliability and qualification of microelectronics for space applications

Expert invited speakers will cover the latest results or work in progress in different areas of microelectronics device reliability and qualification methodologies including:

• Advanced technologies reliability issues
• Product qualification methodology
• Advanced space microprocessors and memories
• RF, analog and mixed-signal device & design issues
• Space radiation effects
• FPGA reliability and qualification issues
• Hardness-by-design
• Designing in reliability
• Reliability for extreme environments
• Advanced packaging issues
• Failure Analysis
• Optoelectronics

Workshop Chair

Ronald Lacoe
The Aerospace Corporation
310.336.0118
ronald.c.lacoe@aero.org

Sponsored by The Aerospace Corporation, the Jet Propulsion Laboratory, and NASA