clsp11p32_lotshaw-fig5


In single-event effects testing with ultrashort-pulse lasers, the short laser pulse deposits electron-hole pairs at selected places in the device under test (DUT) to simulate an energetic particle strike.

In single-event effects testing with ultrashort-pulse lasers, the short laser pulse deposits electron-hole pairs at selected places in the device under test (DUT) to simulate an energetic particle strike.  More »