Piezoresponse-Force Microscopy

Piezoresponse-Force Microscopy Aerospace has developed and successfully applied piezoresponse-force microscopy techniques for nanoscale characterization of the phase contrasts of nonferroelectric and ferroelectric domains in thin-film and bulk dielectric substrates. Piezoresponse-force microscopy permits direct imaging of ferroelectric domain structures with resolution on the order of 3 to 10 nanometers. Traditional atomic-force microscopes can be augmented and […]  More »